Varun Gupta is currently the applications engineering manager for KLA Instruments™, a division of KLA Corporation. During his 8 years at KLA, his main focus area has been defect inspection on compound semiconductor wafers like SiC, GaN, GaAs, InP, etc. being used for Power Device, LED, Communications and Sensing markets. Before joining KLA, he received his MSc in Photonics from Cochin University of Science and Technology, India and PhD in the field of Laser Spectroscopy from University of Basel, Switzerland.

KLA Corporation is a leading supplier of process control and yield management solutions for the semiconductor and related nanoelectronics industries. KLA’s products and services are used by bare wafer, IC, reticle and other manufacturers of materials and equipment around the world, from research and development to final volume manufacturing. Products and services include inline unpatterned and patterned wafer defect inspection, review and classification; reticle defect inspection and metrology; packaging inspection and die sort; critical dimension (CD) metrology; pattern overlay metrology; film thickness, surface topography and composition measurements; measurement of in-chamber process conditions; wafer shape and stress metrology; computational lithography tools; and, overall yield and fab-wide data management and analytics.

KLA Instruments™, a division of KLA Corporation, offers a portfolio of defect inspection and metrology systems, automated and benchtop optical and stylus profilometers, nanoindenters, thin film reflectometers, and sheet resistance mappers. For industry experts, academics and other innovators, KLA Instruments delivers trusted measurements, enabling the world’s breakthrough technologies. The Integrated Optics Company (kla.com)