Donald A. Gajewski, Ph.D., is the Director of the Wolfspeed Reliability Engineering and Failure Analysis Department, covering SiC Power and GaN & LDMOS RF devices, since 2010, and has been in the semiconductor industry since 2000. Don is the chair of JEDEC committee JC-14.7, Reliability/Quality of RF Technologies. Don is also the chair of JEDEC Task Group TG702_1, Reliability Standards for SiC Power Electronic Conversion Semiconductors. Don will be the chair of the 2023 IRPS RF/mmW Committee and was a previous chair of the Reliability of Compound Semiconductors Workshop (ROCS). Don has a Ph.D. in Physics from the University of California, San Diego, and a B.S. in Physics from Case Western Reserve University.